DocumentCode :
1782053
Title :
Main objective of this organized session: "Improving the measurement uncertainty of EMI testing"
Author :
Osabe, Kunihiro
Author_Institution :
Accreditation Oper. Dept., Voluntary EMC Lab. Accreditation Center Inc., Tokyo, Japan
fYear :
2014
fDate :
12-16 May 2014
Firstpage :
245
Lastpage :
246
Abstract :
CISPR 16-4-2 to address the measurement uncertainty of EMI test prescribes MIU (Measurement Instrumentation Uncertainty) of measuring instruments, systems and facilities. And also the product compliance assessment procedure based on MIU is described in the standard. However, since MIU does not embrace the whole source of measurement uncertainty, the contribution to improve MIU of EMI testing is limited in its totality. Especially from a standpoint of improving the reproducibility of testing between testing sites, efforts to reduce MIU will not be rewarded much. Therefore, we should consider the whole source of measurement uncertainty which is called SCU (Standards Compliance Uncertainty). To take into the consideration including whole sources of measurement uncertainty, this session is titled "Improving the measurement uncertainty of EMI testing". And the main objective of this session is to shed light on on-going efforts and to discuss issues relating to standardizing of the optimum solution.
Keywords :
electromagnetic interference; measurement standards; measurement uncertainty; EMI testing; measurement instrumentation uncertainty; measuring instruments; product compliance assessment procedure; standards compliance uncertainty; Frequency measurement; Loss measurement; Measurement uncertainty; Standards; Testing; Uncertainty; Voltage measurement; EMI testing; MIU (Measurement Instrumentation Uncertainty); Measurement Uncertainty; Reproducibility; SCU (Standards Compliance Uncertainty);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), 2014 International Symposium on
Conference_Location :
Tokyo
Type :
conf
Filename :
6997125
Link To Document :
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