DocumentCode :
1782090
Title :
Pulsed laser deposition (PLD) of hafnium oxide thin films
Author :
Plociennik, Przemyslaw ; Zawadzka, Anna ; Strzelecki, Janusz ; Lukasiak, Zbigniew ; Korcala, Andrzej
Author_Institution :
Inst. of Phys., Nicolaus Copernicus Univ., Torun, Poland
fYear :
2014
fDate :
6-10 July 2014
Firstpage :
1
Lastpage :
3
Abstract :
This work contains the experimental investigation of optical properties of HfO2 (hafnium oxide) thin films grown on quartz and n-type silica substrates by pulsed laser deposition method. Cold pressed powders of hafnium oxide (HfO2 98% - Aldrich Chem. Co.) were used as the target for deposition process. The substrates was heated up to temperature in the range between 200 and 500 °C. Optical properties of the films were investigated by transmittance in the ultra-violet, visible and near infrared range and photoluminescence spectroscopy. We measure the photo-luminescence spectra and dynamics of luminescence process. Optical properties are closely related to the structure of the hafnium oxide thin films.
Keywords :
hafnium compounds; heat treatment; infrared spectra; photoluminescence; pressing; pulsed laser deposition; thin films; ultraviolet spectra; visible spectra; HfO2; SiO2; cold pressed powders; experimental analysis; hafnium oxide thin films; heating; luminescence process; n-type silica substrate; near infrared spectroscopy; optical properties; photoluminescence spectroscopy; pulsed laser deposition; quartz substrate; temperature 200 degC to 500 degC; ultraviolet spectroscopy; visible spectroscopy; Hafnium oxide; Laser ablation; Photoluminescence; Pulsed laser deposition; Substrates; Temperature measurement; PLD (Pulsed Laser Deposition); hafnium oxide; photoluminescence; transmission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transparent Optical Networks (ICTON), 2014 16th International Conference on
Conference_Location :
Graz
Type :
conf
DOI :
10.1109/ICTON.2014.6876620
Filename :
6876620
Link To Document :
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