DocumentCode :
17821
Title :
High-resolution imaging of defects in CdTe solar cells using thermoreflectance
Author :
Katz, Noomi ; Patterson, Maxx ; Zaunbrecher, K. ; Johnston, Samuel ; Hudgings, J.
Author_Institution :
Mt. Holyoke College, MA, USA
Volume :
49
Issue :
24
fYear :
2013
fDate :
November 21 2013
Firstpage :
1559
Lastpage :
1561
Abstract :
Thermal imaging of solar cells is important for diagnosing nonuniform operation or point defects, which can reduce cell efficiency. However, imaging with infrared light is impractical for superstrate CdTe cells because the glass substrate blocks transmission of light. It is shown that thermoreflectance - a lock-in technique that detects changes in the reflectivity of visible light - can circumvent this problem and achieve thermal images with spatial resolution limited only by the imaging wavelength. The diagnostic is used to show that a particular defect is a resistive shunt.
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2013.1884
Filename :
6680434
Link To Document :
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