Title :
On-chip magnetic thin-film noise suppressor for IC chip level digital noise countermeasure
Author :
Yamaguchi, Masahiro ; Endo, Yasushi ; Tanaka, Satoshi ; Ito, Tetsuo ; Muroga, Sho ; Azuma, Naoya ; Nagata, Makoto
Author_Institution :
Tohoku Univ., Sendai, Japan
Abstract :
Crossed anisotropy amorphous Co85Zr3Nb12 thin film with total magnetic thickness of 2.0 μm is deposited on to the passivation of a bare IC chip to accommodate intra IC chip level digital-to-RF noise suppression and telecommunication performance. On-chip magnetic film processes can be done as the last steps of Si CMOS back end processes. Radiated emission from embedded arbitrary noise generator is suppressed by more than 10 dB. In-band spurious tone is attenuated by 10 dB. Minimum input power level to meet the 3GPP criteria is improved by 8 dB. All of these results are achieved on the fully LTE compliant RF receiver chain.
Keywords :
CMOS integrated circuits; Long Term Evolution; cobalt alloys; interference suppression; magnetic thin film devices; passivation; radio receivers; silicon; zirconium alloys; 3GPP criteria; CMOS back end processes; Co85Zr3Nb12; IC chip level digital noise countermeasure; LTE; RF receiver chain; Si; amorphous thin film; arbitrary noise generator; bare IC chip; digital-to-RF noise suppression; intra IC chip level; magnetic thickness; minimum input power level; on-chip magnetic film processes; on-chip magnetic thin-film noise suppressor; passivation; size 2.0 mum; telecommunication performance; Couplings; Integrated circuits; Magnetic films; Magnetic resonance; Noise; Permeability; Radio frequency; EMC; RFIC; cellular phone handset; electromagnetic noise suppressor; ferromagnetic film; signal integrity;
Conference_Titel :
Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), 2014 International Symposium on
Conference_Location :
Tokyo