• DocumentCode
    1782139
  • Title

    Correlation power analysis using bit-level biased activity plaintexts against AES cores with countermeasures

  • Author

    Fujimoto, Daisuke ; Miura, Noriyuki ; Nagata, Makoto ; Hayashi, Yuichi ; Homma, Naofumi ; Aoki, Takafumi ; Hori, Yohei ; Katashita, Toshihiro ; Sakiyama, Kazuo ; Thanh-Ha Le ; Bringer, Julien ; Bazargan-Sabet, Pirouz ; Bhasin, Shivam ; Danger, Jean-Luc

  • Author_Institution
    Univ. of Electro-Commun., Chofu, Japan
  • fYear
    2014
  • fDate
    12-16 May 2014
  • Firstpage
    306
  • Lastpage
    309
  • Abstract
    Advanced encryption standard (AES) cores suffer from information leakage through power supply currents, even with the wave dynamic differential logic (WDDL) known as one of the most tolerable countermeasure design styles against side channel attacks (SCA). The set of plaintexts having bit-level biased activities are produced with a known secret key and used for diagnosing the vulnerability of AES cores in their development phases. The CPA with biased plaintexts revealed 128-bit secret keys with less than 4,000 traces from the WDDL AES core both by the measurements and simulations of power supply currents. The core was physically structured by using a 65-nm CMOS standard cell library and assembled on a test vehicle of “SPACES explorer” having an on-board 1-ohm resistor for measuring power supply currents. The derived knowledge should be useful in driving the design of AES cores to be much less prone to information leakage through power supply current and electromagnetic measurements.
  • Keywords
    CMOS integrated circuits; correlation methods; cryptography; AES cores; CMOS standard cell library; advanced encryption standard; bit-level biased activity plaintexts; correlation power analysis; countermeasures; electromagnetic measurements; information leakage; power supply currents; side channel attacks; wave dynamic differential logic; Cryptography; Current measurement; High definition video; Power supplies; Semiconductor device measurement; Standards; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), 2014 International Symposium on
  • Conference_Location
    Tokyo
  • Type

    conf

  • Filename
    6997166