Title :
High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements
Author :
Shigeta, Y. ; Sato, N. ; Arai, K. ; Yamaguchi, M. ; Kageyama, S.
Author_Institution :
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
Abstract :
An on chip active magnetic field probe has been developed for IC chip-level magnetic near field measurements. A low noise amplifier (LNA) and a loop coil were implemented in 0.18 μm Si-CMOS technology, and solder-bonded to PCB to complete the probe. Its gain is 13.3 dB at 2 GHz. The probe is applied for magnetic near field evaluation of a test element group (TEG) chip that emulates Long Term Evolution (LTE)-class radio frequency integrated circuit (RFIC) receiver. It is demonstrated to detect on-chip in-band interference sources.
Keywords :
CMOS analogue integrated circuits; Long Term Evolution; integrated circuit testing; low noise amplifiers; magnetic field measurement; printed circuits; radio receivers; radiofrequency integrated circuits; radiofrequency interference; silicon; CMOS technology; IC chip-level near field measurements; LNA; LTE-class radio frequency integrated circuit receiver; Long Term Evolution; PCB; RFIC receiver; Si; TEG chip; frequency 2 GHz; gain 13.3 dB; loop coil; low noise amplifier; magnetic near field evaluation; on-chip active magnetic field probe; on-chip in-band interference sources; size 0.18 mum; test element group chip; Coils; Magnetic field measurement; Magnetic fields; Magnetic noise; Probes; Semiconductor device measurement; System-on-chip; LTE-class receiver; low noise amplifier; magnetic field probe; magnetic near field measurement;
Conference_Titel :
Electromagnetic Compatibility, Tokyo (EMC'14/Tokyo), 2014 International Symposium on
Conference_Location :
Tokyo
