Title :
Distributed Bragg reflectors: Morphology of cellulose acetate and polystyrene multilayers
Author :
Unger, Katrin ; Resel, Roland ; Czibula, Caterina ; Ganser, Christian ; Teichert, Christian ; Jakopic, Georg ; Canazza, Giancarlo ; Gazzo, Serena ; Comoretto, Davide
Author_Institution :
Inst. of Solid State Phys., Graz Univ. of Technol., Graz, Austria
Abstract :
The optical quality and photonic properties of all-polymer distributed Bragg reflectors are related to the morphology of the layers and the optical responses of the materials. We introduce the X-ray reflectivity method to determine the thickness, the interface- and surface-roughness of cellulose acetate and polystyrene layers which are two polymers often used in the domain of spin casted multilayer systems. Atomic force microscopy and spectroscopic ellipsom-etry were used as complementary techniques for investigating the surface roughness and the film thickness. The shrinkage and the change of interface roughness of the polymers were investigated up to temperatures of 200 °C Up to 170 °C the interface roughness stays constant at about 1 nm while it increases up to 2nm at 200 °C. The thickness of the polystyrene layer remains constant up to 170 °C, well above its glass transition temperature Tg. For cellulose acetate a monothonic decrease is observed with increasing temperature. It could be shown, that the change in the optical response of a thermally treated distributed Bragg reflector is related to the change of the layer thickness of cellulose acetate. Spectra of (PS CA)20PS distributed Bragg reflectors (DBR) are in a good agreement with calculated spectra with parameters optained from of the X-ray reflectivity measurements.
Keywords :
X-ray reflection; atomic force microscopy; distributed Bragg reflectors; glass transition; interface roughness; organic compounds; polymers; shrinkage; surface roughness; thin films; X-ray reflectivity; all-polymer distributed Bragg reflectors; atomic force microscopy; cellulose acetate; film thickness; interface roughness; morphology; optical quality; photonic properties; polystyrene multilayers; shrinkage; spectroscopic ellipsometry; spin casted multilayer systems; surface-roughness; temperature 170 degC to 200 degC; Decision support systems; Distributed Bragg reflectors; Reflectivity; X-ray reflectivity; heat treatment; organic polymer film; thin film morphology;
Conference_Titel :
Transparent Optical Networks (ICTON), 2014 16th International Conference on
Conference_Location :
Graz
DOI :
10.1109/ICTON.2014.6876716