Title :
ATPG for mixed-signal circuits using commercial digital tools
Author :
Wegener, Carsten
Author_Institution :
Corp. Eng., Dialog Semicond. GmbH, Germering, Germany
Abstract :
For digital circuits, Automatic Test Pattern Generation (ATPG) is a commercially solved problem. For circuits which contain analog components, intensive research and some commercial approaches are available.
Keywords :
automatic test pattern generation; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; ATPG; analog components; automatic test pattern generation; commercial digital tools; digital circuits; mixed-signal circuits; Automatic test pattern generation; Circuit faults; Hardware design languages; Integrated circuit modeling; Logic gates; MOS devices; Transistors;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2014 19th International
Conference_Location :
Porto Alegre
DOI :
10.1109/IMS3TW.2014.6997394
