• DocumentCode
    1782629
  • Title

    Diffusion and outgassing of O2 in amorphous SiO2 silica nanoparticles with specific surface properties

  • Author

    Agnello, S. ; Alessi, A. ; Iovino, G. ; Cannas, M. ; Gelardi, F.M. ; Boscaino, R.

  • Author_Institution
    Dept. of Phys. & Chem., Univ. of Palermo, Palermo, Italy
  • fYear
    2014
  • fDate
    12-15 Oct. 2014
  • Firstpage
    73
  • Lastpage
    76
  • Abstract
    Silica nanoparticles with hydrophilic and hydrophobic surface and average diameter of 12 and 40 nm are investigated to study the surface group influence on the diffusion process of molecular oxygen. The O2 diffusion kinetics and molecular solubility are determined by Raman/Photoluminescence measurements. Thermal treatments up to 127°C in controlled atmosphere show that the surface chemistry of nanoparticles is not changed, the equilibrium emission of O2 depends on nanoparticles surface properties, whereas the dynamics of diffusion is surface independent suggesting that surface groups could only affect overall content or detectability of interstitial molecules. The post loading outgassing in nanoparticles of 40 nm average diameters has evidenced a long term stability of embedded O2 in a time scale of months a promising aspect for nanoprobing applications.
  • Keywords
    Raman spectra; amorphous state; hydrophilicity; hydrophobicity; interstitials; nanoparticles; outgassing; particle size; photoluminescence; silicon compounds; solubility; surface chemistry; surface diffusion; O2 diffusion kinetics; O2 outgassing; Raman measurement; SiO2; amorphous silica nanoparticle diameter; diffusion dynamics; equilibrium emission; hydrophilic surface; hydrophobic surface; interstitial molecule detectability; molecular oxygen; molecular solubility; nanoparticle surface properties; nanoprobing application; photoluminescence measurement; size 40 nm; surface chemistry; surface group; thermal treatment; Glass; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference (NMDC), 2014 IEEE 9th
  • Conference_Location
    Aci Castello
  • Type

    conf

  • DOI
    10.1109/NMDC.2014.6997425
  • Filename
    6997425