Title :
An E-band 40dB dynamic range multi-tanh power detector in 0.13μm SiGe technology
Author :
Levinger, R. ; Katz, O. ; Sheinman, B. ; Carmon, R. ; Ben-Yishay, R. ; Mazor, N. ; Pivnik, S. ; Elad, Danny ; Socher, Eran
Author_Institution :
Haifa Labs., IBM, Haifa, Israel
Abstract :
This paper describes circuit design and measurement results of a multi-tanh bipolar rms power detector (PD) for applications in E band (65-86 GHz) frequency range. The PD is designed and fabricated in IBM 0.13um SiGe technology. In the matched frequency range, the measured input dynamic range is over 40 dB, withstanding an input power of 17dBm, with an overall sensitivity of 27.5 mV/dB. The output voltage response is nearly frequency-independent, varying by less than 1.5 dB for a given input RF power, as the RF frequency is swept across the operating frequency range. Static power consumption is 12mW from a 2.7V supply.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; bipolar MIMIC; low-power electronics; network synthesis; E-band dynamic range multitanh power detector; IBM SiGe technology; SiGe; circuit design; frequency 65 GHz to 86 GHz; matched frequency range; multitanh bipolar rms power detector; power 12 mW; size 0.13 mum; static power consumption; voltage 2.7 V; voltage response; BiCMOS integrated circuits; Detectors; Dynamic range; Frequency measurement; Power measurement; Radio frequency; Silicon germanium; E band; SiGe BiCMOS; dynamic range; multi-tanh; rms translinear power detector;
Conference_Titel :
European Microwave Integrated Circuit Conference (EuMIC), 2014 9th
Conference_Location :
Rome
DOI :
10.1109/EuMIC.2014.6997819