DocumentCode :
1783423
Title :
Improved phase linearity in Source Field Plate AlGaN/GaN HEMTs
Author :
Colantonio, P. ; Giannini, F. ; Giofre, R. ; Piazzon, L. ; Camarchia, Vittorio ; Ghione, G. ; Pirola, Marco ; Quaglia, R. ; Nanni, A. ; Pantellini, A. ; Lanzieri, C.
Author_Institution :
DEE, Univ. of Roma Tor Vergata, Rome, Italy
fYear :
2014
fDate :
6-7 Oct. 2014
Firstpage :
349
Lastpage :
352
Abstract :
The benefits of using source field plate (FPS) in AlGaN/GaN HEMTs to reduce the phase distortion in efficient power amplifiers (PAs) is demonstrated in this contribution. The link between phase distortion of a PA and the drain-to-gate feedback parasitic capacitance of the transistor is shown. This link leads to critical phase nonlinearity expecially when architectures based on output load modulation, as the Doherty topology, are adopted. The FPS effect in reducing the feedback parasitic capacitance and, thus, the AM/PM distortion of the PA is verified. For experimental validation two AlGaN/GaN HEMT structures, with and without FPS, are realized and compared in order to extract the effects of FPS. Source-load pull characterizations are performed on both structures in order to verify the benefits of FPS on phase distortion, both in fixed and modulated output load conditions.
Keywords :
aluminium compounds; amplitude modulation; capacitance; gallium compounds; high electron mobility transistors; phase modulation; power amplifiers; AM-PM distortion; AlGaN-GaN; AlGaN-GaN HEMT; Doherty topology; FPS; critical phase nonlinearity; drain-to-gate feedback parasitic capacitance; output load modulation; phase distortion; power amplifiers; source field plate; source-load pull characterizations; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Performance evaluation; Phase distortion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Microwave Integrated Circuit Conference (EuMIC), 2014 9th
Conference_Location :
Rome
Type :
conf
DOI :
10.1109/EuMIC.2014.6997864
Filename :
6997864
Link To Document :
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