DocumentCode :
1783425
Title :
Soft compression and the origins of nonlinear behavior of GaN HEMTs
Author :
Pedro, Jose C. ; Nunes, Luis C. ; Cabral, Pedro M.
Author_Institution :
Inst. de Telecomun., Univ. de Aveiro, Aveiro, Portugal
fYear :
2014
fDate :
6-7 Oct. 2014
Firstpage :
353
Lastpage :
356
Abstract :
This work responds to the commonly formulated question in PA design of “Why do GaN HEMTs´ nonlinear behavior seems so distinct from the one of their Si LDMOS, GaAs MESFETs or HEMTs counterparts?”. Starting from some recent results on the origin of AM/AM and AM/PM distortion in power amplifiers made for these two device types, we demonstrate that there is no fundamental reason why the devices should be different, except that the formers suffer from a noticeable low-frequency dispersion. Then, we dig into this particular aspect of GaN HEMT operation, to show that this charge trapping-related phenomenon is responsible for a severe self-biasing capable of inducing soft-compression of an otherwise almost flat AM/AM gain plot - when measured with static CW tests - which, in fact, corresponds to a severe gain expansion when the AM/AM is assessed with more realistic dynamic tests performed with real communication signals. And it is this class-C PA like AM/AM that is responsible for the recognized GaN HEMT nonlinearity.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; elemental semiconductors; gallium arsenide; gallium compounds; high electron mobility transistors; nonlinear distortion; power amplifiers; silicon; wide band gap semiconductors; AM-AM distortion; AM-PM distortion; GaAs; GaAs MESFET; GaN; GaN HEMT; Si; Si LDMOS; charge trapping; commonly formulated question; low-frequency dispersion; nonlinear behavior; power amplifier design; self-biasing; soft compression; Gain; Gallium nitride; HEMTs; MODFETs; Microwave amplifiers; Power amplifiers; Silicon; GaN HEMT; Gain compression; nonlinear distortion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Microwave Integrated Circuit Conference (EuMIC), 2014 9th
Conference_Location :
Rome
Type :
conf
DOI :
10.1109/EuMIC.2014.6997865
Filename :
6997865
Link To Document :
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