DocumentCode :
1783430
Title :
High bandwidth investigations of a baseband linearization approach formulated in the envelope domain under modulated stimulus
Author :
Ogboi, F.L. ; Tasker, P.J. ; Akmal, M. ; Lees, J. ; Benedikt, J. ; Bensmida, S. ; Morris, Kirsten ; Beach, M. ; McGeehan, Joe
Author_Institution :
Centre for High Freq. Eng., Cardiff Univ., Cardiff, UK
fYear :
2014
fDate :
6-7 Oct. 2014
Firstpage :
361
Lastpage :
364
Abstract :
Baseband injection provides a useful approach for use in linearizing power amplifiers. The challenge is the determination of the required baseband signal. In [6] a generalized formulation quantifying the baseband voltage signal, injected at the output bias port, to linearize the device behavior was introduced. This envelope domain based solution requires the determination of only a small number of linearizing coefficients. More importantly these coefficients should be stimulus, hence bandwidth independent. This property has been experimentally investigated using a 10W Cree GaN HEMT device under a 3-tone modulated stimulus at 1.5dB of compression. It will be shown that the linearization coefficients were invariant when varying the modulation bandwidth from 2MHz to 20MHz.
Keywords :
III-V semiconductors; gallium compounds; high electron mobility transistors; linearisation techniques; modulation; power amplifiers; wide band gap semiconductors; Cree GaN HEMT device; GaN; baseband injection; baseband linearization; baseband voltage signal; envelope domain based solution; frequency 2 MHz to 20 MHz; linearizing coefficients; modulated stimulus; modulation bandwidth; output bias port; power 10 W; power amplifiers; Bandwidth; Baseband; Current measurement; Microwave amplifiers; Modulation; Radio frequency; Voltage measurement; bandwidth; distortion; independence; modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Microwave Integrated Circuit Conference (EuMIC), 2014 9th
Conference_Location :
Rome
Type :
conf
DOI :
10.1109/EuMIC.2014.6997867
Filename :
6997867
Link To Document :
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