Experrmental study of particle removal with PLZT induced voltages

In this paper, an initiative charged particles cleaning research based on PLZT was developed to solve performance degradation and other issues of optics which were caused by surface adhesion between charged particles and optics. Firstly, a constitutive model of particles based on discrete element theory was established because of characteristics of charged particles such as small size and being charged, etc. This model is based on the existing model(which makes full reference of existing particle surface energy model, etc.), including van der Waals forces, charged forces and other properties of forces between the particles. Secondly, this paper analyzed characteristics of the electric field between the surface of optics and the PLZT after the PLZT was irradiated by U V, then established the effect model among the PLZT, the surface of optics and charged particles. Finally, a principle experiment of active dust removal based on PLZT was done by using PLZT, UV light source, industrial pollution particles, etc. The results showed that the electrostatic field caused by existing PLZT was strong enough to absorb the industrial pollution particles after irradiation by UV light source. Thus achieved the purpose of active dust removal, which could also verify the feasibility and effectiveness of the PLZT active dust removal technology.