Title :
Ferroelectric polymer films for flexible memory devices
Author :
Micjan, M. ; Nevrela, J. ; Novota, M. ; Flickyngerova, S. ; Juhasz, P. ; Uhrik, J. ; Jakabovic, J. ; Weis, M.
Author_Institution :
Inst. of Electron. & Photonics, Slovak Univ. of Technol., Bratislava, Slovakia
Abstract :
Here we demonstrate application of organic ferroelectric insulating material: copolymer vinylidene fluoride and trifluoroethylene P(VDF-TrFE) for organic memory devices. The metal-insulator-metal structures have been used to study the ferroelectric properties and represent the model applications for ferroelectric field-effect transistors (FeFETs) and ferroelectric random access memories (FRAM). The current-voltage and capacitance-voltage characteristics depicted ferroelectric switching phenomenon present in thin-film structures and polarization properties have been analysed. This work describes the MIM device fabrication technology as well as the evaluation of material properties: saturated polarization, maximum electric field intensity, critical electric field, and relative dielectric constant.
Keywords :
MIM devices; ferroelectric storage; ferroelectric switching; ferroelectric thin films; flexible electronics; organic field effect transistors; polymer blends; FRAM; FeFET; MIM device fabrication technology; PVDF-TrFE; capacitance-voltage characteristics; copolymer vinylidene fluoride; critical electric field; current-voltage characteristics; ferroelectric field-effect transistors; ferroelectric properties; ferroelectric random access memories; ferroelectric switching phenomenon; material properties; maximum electric field intensity; metal-insulator-metal structures; organic ferroelectric insulating material; organic memory devices; polarization properties; relative dielectric constant; saturated polarization; thin-film structures; trifluoroethylene; Annealing; Capacitance; Capacitance-voltage characteristics; Electrodes; Fabrication; Films;
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4799-5474-2
DOI :
10.1109/ASDAM.2014.6998654