Title :
Integrated waveguide interferometer with picometric performances
Author :
Missoffe, A. ; Olivier, S. ; Cagneau, B. ; Millier, P. ; Guan, Haiyan ; Chassagne, Luc
Author_Institution :
IADI-INSERM, Univ. de Lorraine, Vandoeuvre-lès-Nancy, France
Abstract :
We present an integrated optical waveguide interferometer highly compact and easy-to-use. Metrological study is focused on the resolution and the noise level of the sensor. A standard Allan deviation lower than 50 pm has been observed in standard environment. Power spectral densities up to 150 fm. Hz-1/2 at 10 kHz are achieved. The flicker level is not reached because of the environmental conditions but the high frequency noise is likely to be lower than 100 fm. Hz-1/2. We present measures for steps of 0.5 nm at a sample frequency of 1 kHz. Although we use it as sensing motions measurement over micrometric range, the maximum displacement range is 5 centimeters depending on the output lens which is used.
Keywords :
flicker noise; lenses; light interferometers; motion measurement; optical sensors; optical waveguides; distance 5 cm; flicker noise level; frequency 1 kHz; frequency 10 kHz; integrated optical waveguide interferometer; metrological study; motions measurement; output lens; picometric performance; power spectral density; sensor; size 0.5 nm; standard Allan deviation; Frequency measurement; Mirrors; Optical fiber sensors; Optical fibers; Optical interferometry;
Conference_Titel :
Advanced Intelligent Mechatronics (AIM), 2014 IEEE/ASME International Conference on
Conference_Location :
Besacon
DOI :
10.1109/AIM.2014.6878233