Title :
Analysis of interfering signals in structures of integrated circuits
Author :
Novak, Jiri ; Foit, J.
Author_Institution :
Dept. of Microelectron., Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
The electromagnetic compatibility serves as a measure for the possibility of coexistence of numerous electronic systems occupying a common environment without unwanted electromagnetic couplings that could interfere with correct functioning of individual systems [1]. The integrated circuits can be assumed to be independent electronic systems set up of individual operational blocks. The conveying of signals between blocks is provided by networks of electrical leads.
Keywords :
electromagnetic compatibility; electromagnetic coupling; integrated circuit interconnections; electrical leads; electromagnetic compatibility; electromagnetic couplings; integrated circuits structures; Couplings; Integrated circuit modeling; Joining processes; Logic gates; Pollution measurement; Voltage measurement;
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4799-5474-2
DOI :
10.1109/ASDAM.2014.6998688