DocumentCode :
1784433
Title :
Total internal reflection ellipsometry in the investigation of phenomena at surfaces and interfaces for biosensing
Author :
Chlpik, J. ; Bombarova, K. ; Cirak, J.
Author_Institution :
Dept. of Phys., Slovak Univ. of Technol., Bratislava, Slovakia
fYear :
2014
fDate :
20-22 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
Ellipsometry, particularly spectroscopic ellipsometry, is a very sensitive, nondestructive experimental technique of thin film characterisation. The recently proposed method of Total internal reflection ellipsometry (TIRE) combines the advantages of spectroscopic ellipsometry and the Kretschmann type SPR geometry of total internal reflection. The modeling reveals detection limit of changes in the bulk refractive index, Δnb= 1.5×10-6 which represents the instrumental potential for detecting an analyte at several pmol/liter in a solution. These results were proven by experimental studies on monitoring changes in adsorbed layers (at the metal / dielectric interface) caused by specific binding of biomolecules from the surrounding solution.
Keywords :
bio-optics; biosensors; ellipsometry; Kretschmann type SPR geometry; biosensing; bulk refractive index; interface phenomena; nondestructive experimental technique; spectroscopic ellipsometry; surface phenomena; thin film characterisation; total internal reflection ellipsometry; Ellipsometry; Metals; Optical surface waves; Plasmons; Reflection; Surface waves; Tires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2014 10th International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4799-5474-2
Type :
conf
DOI :
10.1109/ASDAM.2014.6998699
Filename :
6998699
Link To Document :
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