Title :
A novel reconstruction algorithm for the improvement of SMOS brightness temperatures
Author :
Gonzalez-Gambau, V. ; Turiel, Antonio ; Martinez, Jose Luis ; Olmedo, E. ; Corbella, I.
Author_Institution :
Inst. de Cienc. del Mar, Barcelona, Spain
Abstract :
RFI (Radio Frequency Interference) sources, Sun signal and even land-sea transitions may generate large sidelobes that corrupt SMOS brightness temperature products and therefore, the quality of the soil moisture and sea surface salinity retrievals. This work focuses on the reduction of this Gibbs-like contamination in brightness temperature scenes using an alternative image reconstruction approach. This technique is based on sampling the signal at the nodal points, that is, at those points at which the oscillating interference causes the minimum distortion to the geophysical signal. The method has been successfully tested using ocean views significantly reducing general ripples and sidelobes in the contaminated brightness temperature images. In addition, it reduces the standard deviation of the difference between the SMOS measurements and the theoretical model by 1K, which is crucial to improve the quality of the sea surface salinity retrievals.
Keywords :
geophysical image processing; geophysical techniques; image reconstruction; radiofrequency interference; remote sensing; Gibbs-like contamination; RFI sources; SMOS brightness temperatures; alternative image reconstruction approach; contaminated brightness temperature images; geophysical signal; land-sea transitions; nodal points; novel reconstruction algorithm; radio frequency interference; sea surface salinity retrievals; sun signal; Brightness temperature; Oceans; Pollution measurement; Sea measurements; Standards; Temperature measurement; Radio Frequency Interference; SMOS; image reconstruction; interferometric radiometer; nodal sampling; sidelobes;
Conference_Titel :
Microwave Radiometry and Remote Sensing of the Environment (MicroRad), 2014 13th Specialist Meeting on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4799-4645-7
DOI :
10.1109/MicroRad.2014.6878922