Title :
Noise sources for internal calibration of millimeter-wave radiometers
Author :
Parashare, Chaitali R. ; Kangaslahti, Pekka P. ; Brown, Shannon T. ; Padmanabhan, Sharmila ; Tanner, Alan B. ; Montes, Oliver ; Dawson, Douglas E. ; Gaier, Todd C. ; Reising, Steven C. ; Hadel, Victoria D. ; Johnson, Thaddeus P. ; Bosch-Lluis, Xavier
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We have developed noise sources at 90 GHz, 130 GHz and 168 GHz each using a custom-designed beam-lead noise diode from M-Pulse Microwave Inc. These noise sources measure a high excess noise ratio (ENR) of 17 dB, 9.6 dB and 6 dB at 90 GHz, 130 GHz and 168 GHz, respectively and are to be used for internal calibration in the high-frequency millimeter-wave nadir-viewing radiometers, which are expected to provide increased spatial resolution of wet-tropospheric path delay correction for coastal regions and inland water. The noise sources meet the ENR, radiometric stability, mass and size requirements, which enables us to achieve internal calibration for the high-frequency millimeter-wave channels. Furthermore, we have developed a novel approach that utilizes a MMIC LNA as a noise source in the 168 GHz frequency band. Both of these noise sources have demonstrated excellent stability of 0.07% per hour. This translates to <; 0.1K per hour TA stability for cold ocean scene.
Keywords :
atmospheric measuring apparatus; atmospheric techniques; calibration; radiometers; M-Pulse Microwave Inc; coastal regions; custom-designed beam-lead noise diode; frequency 130 GHz; frequency 168 GHz; frequency 90 GHz; high-frequency millimeter-wave nadir-viewing radiometers; internal calibration; noise sources; wet-tropospheric path delay correction; Calibration; MMICs; Microwave radiometry; Noise; Radiometers; Switches; Thermal stability; ENR; Internal Calibration; Millimeter-Wave Radiometers; Noise Diode;
Conference_Titel :
Microwave Radiometry and Remote Sensing of the Environment (MicroRad), 2014 13th Specialist Meeting on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4799-4645-7
DOI :
10.1109/MicroRad.2014.6878930