• DocumentCode
    1785723
  • Title

    Novel fault tolerant QCA circuits

  • Author

    Mahmoodi, Yasamin ; Tehrani, Mohammad A.

  • Author_Institution
    Electr. & Comput. Nano-Technol. Lab., Shahid Beheshti Univ., Tehran, Iran
  • fYear
    2014
  • fDate
    20-22 May 2014
  • Firstpage
    959
  • Lastpage
    964
  • Abstract
    In this paper we present a fault tolerant full adder cell as well as a fault tolerant serial adder circuit. It is worthwhile that this is the first time that a real fault tolerant full adder cell has been proposed. This is the very same for the fault tolerant serial adder cell. We have also generated a program to assess the fault tolerance. While the other full adder designs seem to be sensitive to fault, it seems that the proposed cells are much more fault tolerant.
  • Keywords
    adders; cellular automata; circuit reliability; fault tolerance; logic design; nanoelectronics; semiconductor quantum dots; fault tolerant QCA circuits; fault tolerant full adder cell; fault tolerant serial adder circuit; quantum dot cellular automata; Adders; Clocks; Fault tolerance; Fault tolerant systems; Layout; Logic gates; Wires; Defect; Fault tolerant; Full Adder; Quantum dot Cellular Automata; Serial Adder;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering (ICEE), 2014 22nd Iranian Conference on
  • Conference_Location
    Tehran
  • Type

    conf

  • DOI
    10.1109/IranianCEE.2014.6999674
  • Filename
    6999674
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1785723