DocumentCode :
1785760
Title :
Spectral and temporal phase measurement by optical frequency-domain reflectometry
Author :
Calo, C. ; Robillart, Bruno ; Gottesman, Yaneck ; Fall, Aboulaye ; Lamare, Francois ; Merghem, K. ; Martinez, A. ; Ramdane, A. ; Bcnkelfat, Badr-Eddine
Author_Institution :
Lab. for Photonics & Nanostruct. LPN, Marcoussis, France
fYear :
2014
fDate :
11-15 May 2014
Firstpage :
1
Lastpage :
2
Abstract :
In the present work, we report on the spectral and temporal phase measurement capabilities of OFDR. Precise characterization of spectral phase information is demonstrated by retrieving the phase response of a commercial optical filter, the Finisar Waveshaper 1000 S/X programmable in attenuation and phase over C+L band (1530-1625 nm). Additionally, we demonstrate the high sensitivity of the technique to Doppler effects, enabling the use of OFDR for the characterization of dynamical aspects of optoelectronic components.
Keywords :
Doppler effect; frequency-domain analysis; optical filters; reflectometry; Doppler effects; Finisar Waveshaper 1000 S/X; optical filter; optical frequency-domain reflectometry; optoelectronic components; phase over C+L band; phase response; spectral phase measurement; temporal phase measurement; wavelength 1530 nm to 1625 nm; Optical fibers; Optical filters; Optical interferometry; Optical reflection; Optical sensors; Optical variables measurement; Phase measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials (IPRM), 26th International Conference on
Conference_Location :
Montpellier
Type :
conf
DOI :
10.1109/ICIPRM.2014.6880541
Filename :
6880541
Link To Document :
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