Title :
Cryogenic GaN/AlGaN HEMT ICs and fabrication probability of monolithic sensor of super- and semiconductor devices
Author :
Hibi, Y. ; Jiandong Sun ; Hua Qin ; Matsuo, Hiroshi ; Lin Kang ; Jian Chen ; Peiheng Wu
Author_Institution :
Res. Inst. of Supercond. Electron., Nanjing Univ., Nanjing, China
Abstract :
GaN/AlGaN HEMTs are usually used as high speed circuit elements and fabricated onto silicon or sapphire substrate. Since they also show good cryogenic properties even in low power condition (~1 μW/1 HEMT), we designed and fabricated some GaN/AlGaN HEMT integrated circuits. By using source follower with sample-and-hold which is one of the ICs, performance as source follower and sample-and-hold is confirmed. Now we have investigated how to fabricate superconductor devices onto the substrate which GaN/AlGaN HEMT devices are already fabricated. When we realize this technique, some new monolitic instruments with super- and semiconductor devices may be made come true.
Keywords :
HEMT integrated circuits; III-V semiconductors; aluminium compounds; cryogenic electronics; gallium compounds; high electron mobility transistors; integrated circuit design; integrated circuit manufacture; integrated circuit technology; low-power electronics; probability; sample and hold circuits; sensors; superconducting devices; wide band gap semiconductors; GaN-AlGaN; cryogenic HEMT IC; high speed circuit element; integrated circuit fabrication; monolithic sensor; probability; sample-and-hold circuit; sapphire substrate; semiconductor device; silicon substrate; source follower; superconductor device; Aluminum gallium nitride; Cryogenics; Gallium nitride; HEMTs; Logic gates; Silicon; Substrates; Cryogenic IC; GaN/AlGaN HEMT; Supe- and Semiconductor Monolitic Instrument;
Conference_Titel :
Low Temperature Electronics (WOLTE), 2014 11th International Workshop on
Conference_Location :
Grenoble
DOI :
10.1109/WOLTE.2014.6881017