DocumentCode :
1786158
Title :
A quantum device driven by an on-chip CMOS ring oscillator
Author :
Clapera, P. ; Ray, Sambaran ; Jehl, Xavier ; Sanquer, Marc ; Valentian, Alexandre ; Barraud, S.
Author_Institution :
INAC-SPSMS, Univ. Grenoble Alpes, Grenoble, France
fYear :
2014
fDate :
7-9 July 2014
Firstpage :
73
Lastpage :
76
Abstract :
We present the co-integration of a ring-oscillator based CMOS circuit purposely designed to drive RF signals onto the gates of a single-electron device. It is fabricated on 300 mm wafers with the nanowire silicon-on-insulator technology and operated at cryogenic temperatures. Using the same technology for both the classical circuit and the quantum device is a unique opportunity which is implemented by simply changing the width of the field-effect transistors. While 25 nm widths yield devices behaving as quantum devices, 1μm relaxed widths guarantee a safe operation of the CMOS circuit since its components behave as regular Field-Effect transistors. We demonstrate the operation of the circuit at low temperature and observed the generation of DC currents in the absence of any applied DC bias. The generated DC current can be well explained in the framework of a rectification model [8]. The successful operation of such a co-integrated circuit can be very promising for future integration of quantum nanoelectronic devices.
Keywords :
CMOS analogue integrated circuits; cryogenic electronics; field effect analogue integrated circuits; nanoelectronics; nanowires; oscillators; silicon-on-insulator; DC currents; RF signals; applied DC bias; co-integrated circuit; cryogenic temperatures; field-effect transistors; nanowire silicon-on-insulator technology; on-chip CMOS ring oscillator; quantum nanoelectronic devices; rectification model; single-electron device; size 1 mum; size 25 nm; size 300 mm; CMOS integrated circuits; Current measurement; Logic gates; Nanoscale devices; Radio frequency; Voltage-controlled oscillators; Cryogenic electronics; MOSFET circuits; Single electron transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Temperature Electronics (WOLTE), 2014 11th International Workshop on
Conference_Location :
Grenoble
Type :
conf
DOI :
10.1109/WOLTE.2014.6881029
Filename :
6881029
Link To Document :
بازگشت