DocumentCode :
1786167
Title :
Defect Density Measurements Using COSMIC - Experiences with Mobile Apps and Embedded Systems
Author :
Fehlmann, Thomas ; Kranich, Eberhard
Author_Institution :
Euro Project Office AG, Zurich, Switzerland
fYear :
2014
fDate :
6-8 Oct. 2014
Firstpage :
17
Lastpage :
22
Abstract :
Defect Density Measurements based on functional size have big advantages over traditional approaches based on counting entries in defect repositories. Using structural information, defects can be located within data movements using the ISO/IEC 19761 COSMIC framework. Consequently, defect counts and defect density indicators become comparable among different projects and products, and can even be used for contracting purposes and in acceptance criteria. This article explores modern defect density measurements in two different areas: first, in mobile apps, where functionality spreads between server and devices and defects might arise at communication interfaces between server and devices, and second, in instruments with embedded software ("Internet of Things"), where defects occur when interfacing between different functional users. This yields new insights into origin of defects, and, consequently, leads to defect avoidance strategies. Also, it is shown how ISO/IEC 20926 IFPUG can be used to identify layered application boundaries within the counting scope, establishing effective test scenarios useful for counting defects with ISO/IEC 19761 COSMIC. A best practice for setting application boundaries is proposed that applies both to IFPUG and COSMIC.
Keywords :
IEC standards; ISO standards; contracts; embedded systems; file servers; program testing; software development management; COSMIC; ISO-IEC 19761 COSMIC framework; ISO-IEC 20926 IFPUG; acceptance criteria; contracting purposes; defect counts; defect density indicators; defect density measurements; defect repositories; defect server; embedded software; functional size; structural information; IEC standards; ISO standards; Six sigma; Software; Software measurement; Testing; Unified modeling language; Embedded Software; Functional Sizing; Internet of Things; Layers; Lean Six Sigma; Mobile Apps; Software Metrics; Software Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Measurement and the International Conference on Software Process and Product Measurement (IWSM-MENSURA), 2014 Joint Conference of the International Workshop on
Conference_Location :
Rotterdam
Type :
conf
DOI :
10.1109/IWSM.Mensura.2014.23
Filename :
7000069
Link To Document :
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