DocumentCode :
1786181
Title :
Tunnel FET based low voltage static vs dynamic logic families for energy efficiency
Author :
Subramanyam, Kasturi ; Shaik, Sadulla ; Vaddi, Ramesh
Author_Institution :
Electron. & Commun. Eng. Dept., VFSTR Univ., Guntur, India
fYear :
2014
fDate :
16-18 July 2014
Firstpage :
1
Lastpage :
2
Abstract :
Tunnel FETs as steep slope devices have attracted attention for achieving energy efficiency at low supply voltages. This paper presents the design of Hetero-junction Tunnel FET (HTFET) based logic gates for static and dynamic logic topologies for the first time. Comparison is also done with 20nm Si FinFET technology with supply voltage scaling. Due to the steep slope characteristics, HTFET topologies have improved energy efficiency in comparison to Si FinFET configurations. It has been observed that HTFET static logic gate (two input NAND) is ~60% more energy efficient then Si FinFET static logic gate. One of the key findings from this work is that HTFET dynamic logic gates outperform HTFET static gates and FinFET designs in terms of energy efficiency due to HTFET´s steep slope, low static power and reduced delay values. The HTFET dynamic logic gate has ~65% less energy consumption than HTFET static NAND gate and ~56% less energy consumption than FinFET dynamic NAND gate at Vdd=0.2V.
Keywords :
MOS logic circuits; elemental semiconductors; logic gates; low-power electronics; silicon; FinFET dynamic NAND gate; HTFET dynamic logic gate; HTFET static NAND gate; HTFET static logic gate; HTFET topology; Si; delay value reduction; dynamic logic topology; energy efficiency; heterojunction tunnel FET; low-static power; silicon FinFET static logic gate; silicon FinFET technology; size 20 nm; static logic topology; steep slope devices; supply voltage scaling; tunnel FET-based low-voltage dynamic logic families; tunnel FET-based low-voltage static logic families; voltage 0.2 V; Energy consumption; Energy efficiency; FinFETs; Integrated circuit modeling; Logic gates; Silicon; Voltage control; Energy efficiency; FinFET; Logic families; Steep slope devices; Tunnel FETs; Ultra low power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and Test, 18th International Symposium on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-5088-1
Type :
conf
DOI :
10.1109/ISVDAT.2014.6881042
Filename :
6881042
Link To Document :
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