DocumentCode :
1786253
Title :
Design of a new high order OTA-C filter structure and its specification based testing
Author :
Ghosh, Koushik ; Ray, B.N.
Author_Institution :
Dept. of Electron. & Telecommun. Eng., Indian Inst. of Eng. Sci. & Technol., Shibpur, India
fYear :
2014
fDate :
16-18 July 2014
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents a new higher order current mode filter structure based on Operational transconductance amplifier and capacitor (OTA-C). The structure fulfils the three main criteria of high frequency operation: (i) It employs minimum number of active and passive components (ii) It employs only single ended input OTAs to overcome feedthrough effects. (iii) It uses only grounded capacitor which is useful for integration and absorb shunt capacitance. Any nth order transfer function can be realised from it. Fourth order low pass elliptic filter is designed and simulated. HSPICE simulation with BSIM level 53 model and 0.13 μm process confirm the theoretical analysis. The second part of the paper proposes a new method of specification based parametric fault detection of higher order linear analog circuit where a number of test nodes are accessible. The method is illustrated with designed fourth order low pass elliptic filter. Current gains at different stage of the filter are used for fault detection. Using montecarlo simulation the value of each component of the circuit is varied within its tolerance limit and minimum and maximum values of the each current gain are found for the fault free circuit. At the time of testing, the current gains are found for the injected fault and if any one or more current gain are found out of bound then the circuit is faulty. Numerical results are presented to clarify the proposed method and to prove its efficiency.
Keywords :
Monte Carlo methods; active filters; capacitors; circuit testing; elliptic filters; fault diagnosis; low-pass filters; network synthesis; operational amplifiers; passive filters; transfer functions; BSIM level 53 model; Fourth order low pass elliptic filter; HSPICE simulation; Monte Carlo simulation; active component; fault free circuit; grounded capacitor; high order OTA-C filter structure; higher order linear analog circuit; nth order transfer function; operational transconductance amplifier; parametric fault detection; passive component; shunt capacitance; size 0.13 mum; specification based testing; Artificial intelligence; Capacitors; Electrical fault detection; Fault detection; Testing; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and Test, 18th International Symposium on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-5088-1
Type :
conf
DOI :
10.1109/ISVDAT.2014.6881074
Filename :
6881074
Link To Document :
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