Title :
Loop unrolling with fine grained power gating for runtime leakage power reduction
Author :
Pyne, Sumanta ; Pal, Arnab
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, Kharagpur, India
Abstract :
The present work introduces a compilation technique to reduce runtime leakage power of functional units of a processor by combining loop unrolling with power gating. The instructions in the unrolled loop are scheduled to provide opportunities for power gating the functional units which are not in need for a considerable amount of time. The number of clock cycles taken by the power gating instructions is less than or equal to the number of clock cycles saved by loop unrolling. This results in 23-64% reduction of the total energy consumed by the benchmark programs without any degradation of performance.
Keywords :
integrated circuit design; microprocessor chips; benchmark programs; clock cycles; compilation technique; fine grained power gating; loop unrolling; processor functional units; runtime leakage power reduction; Assembly; Hazards; High level languages; Logic gates; Power dissipation; Registers; Switches; Clustering of instructions; fine grained power gating; grouping of instructions; inter-iteration data dependence; leakage power; loop unrolling; power gating instructions;
Conference_Titel :
VLSI Design and Test, 18th International Symposium on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-5088-1
DOI :
10.1109/ISVDAT.2014.6881084