DocumentCode :
1786280
Title :
Design of a fault tolerant low-order interleaved memory based on the concept of bubble-stack an image storage perspective
Author :
Das, S. ; Dey, Shuvashis
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. Inst. of Technol., Burdwan, India
fYear :
2014
fDate :
16-18 July 2014
Firstpage :
1
Lastpage :
6
Abstract :
Memory access rates have been the shortfall of modern computing systems with increasing processor speed. High speed processors do not perform as expected due to relative low data access rates of the concerned memory. Development of a memory system with higher accessing speed is therefore the need of hour. The concept of low-order interleaved memory systems with high throughput neutralises the speed gap between processor and memory. Interleaved memory systems can also be designed in a high-order fashion to make it fault tolerant. But, a fault tolerant high-order interleaved memory lacks the speed advantage. Therefore, designing a high speed low-order interleaved memory with properties of fault tolerance remained as a challenging area of research since decades. This paper proposes a design of low-order interleaved memory system which displays a high degree of fault tolerance without compromise in speed and storage space.
Keywords :
fault tolerance; integrated circuit design; integrated circuit reliability; interleaved storage; storage management chips; access speed; bubble-stack concept; computing systems; data access rates; fault-tolerant high-order interleaved memory; fault-tolerant low-order interleaved memory design; high-speed low-order interleaved memory; high-speed processors; image storage perspective; memory access rates; memory system development; storage space; Circuit faults; Fault location; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Memory management; Multiplexing; Memory bandwidth; bubble-stack; fault tolerance; field programmable gate array; fine grain; interleaved memory; processor utilization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and Test, 18th International Symposium on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-5088-1
Type :
conf
DOI :
10.1109/ISVDAT.2014.6881087
Filename :
6881087
Link To Document :
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