Title :
Implicitly Constrained Semi-supervised Linear Discriminant Analysis
Author :
Krijthe, Jesse H. ; Loog, Marco
Author_Institution :
Pattern Recognition Lab., Delft Univ. of Technol., Delft, Netherlands
Abstract :
Semi-supervised learning is an important and active topic of research in pattern recognition. For classification using linear discriminant analysis specifically, several semi-supervised variants have been proposed. Using any one of these methods is not guaranteed to outperform the supervised classifier which does not take the additional unlabeled data into account. In this work we compare traditional Expectation Maximization type approaches for semi-supervised linear discriminant analysis with approaches based on intrinsic constraints and propose a new principled approach for semi-supervised linear discriminant analysis, using so-called implicit constraints. We explore the relationships between these methods and consider the question if and in what sense we can expect improvement in performance over the supervised procedure. The constraint based approaches are more robust to misspecification of the model, and may outperform alternatives that make more assumptions on the data in terms of the log-likelihood of unseen objects.
Keywords :
expectation-maximisation algorithm; learning (artificial intelligence); pattern classification; classification task; expectation maximization type approaches; implicitly constrained semisupervised linear discriminant analysis; intrinsic constraints; pattern recognition; performance improvement; principled approach; semisupervised learning; supervised classifier; unseen object log-likelihood; Covariance matrices; Equations; Labeling; Linear discriminant analysis; Mathematical model; Pattern recognition; Semisupervised learning;
Conference_Titel :
Pattern Recognition (ICPR), 2014 22nd International Conference on
Conference_Location :
Stockholm
DOI :
10.1109/ICPR.2014.646