• DocumentCode
    1786707
  • Title

    One-shot calibration of rf circuits based on non-intrusive sensors

  • Author

    Andraud, Martin ; Stratigopoulos, Haralampos-G ; Simeu, Emmanuel

  • Author_Institution
    Grenoble INP, UJF, Grenoble, France
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We propose a post-fabrication calibration technique for RF circuits that is performed during production testing with minimum extra cost. Calibration is enabled by equipping the circuit with tuning knobs and sensors. Optimal tuning knob identification is achieved in one-shot based on a single test step that involves measuring the sensor outputs once. For this purpose, we rely on variation-aware sensors which provide measurements that remain invariant under tuning knob changes. As an auxiliary benefit, the variation-aware sensors are non-intrusive and totally transparent to the circuit. The technique is demonstrated on a 65nm RF power amplifier.
  • Keywords
    calibration; integrated circuit testing; radiofrequency integrated circuits; radiofrequency power amplifiers; sensors; tuning; RF circuits; RF power amplifier; nonintrusive sensors; post fabrication calibration technique; production testing; size 65 nm; tuning knobs; variation-aware sensors; Calibration; Integrated circuit modeling; Predictive models; Radio frequency; Sensors; System-on-chip; Tuning; Analog/RF IC calibration and testing; non-intrusive sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • Filename
    6881337