• DocumentCode
    1786772
  • Title

    Harmonic tuned RF/microwave high efficiency power amplifier design accessing the intrinsic drain

  • Author

    Moreno-Rubio, J.J. ; Angarita-Malaver, E.F. ; Perez-Mancera, L.F. ; Burgos, N.R. ; Cuevas-Carrero, W.A.

  • Author_Institution
    Dept. de Electron., Univ. Pedagogica y Tecnol. de Colombia, Sogamoso, Colombia
  • fYear
    2014
  • fDate
    12-14 Nov. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A specific design technique of harmonic tuned power amplifiers based on FET device assumption is developed in this paper. The main issue of this methodology is to understand how to access the device´s intrinsic drain. Design equations are presented for the distributed output matching networks, which can be used independently of the harmonic tuned amplifier type. In order to validate the presented technique, two hybrid amplifiers have been implemented, the former is a Tuned Load power amplifier and the latter is an inverse Class F one. The superiority of the inverse Class F amplifier, in terms of efficiency, gain and output power, has been demonstrated. The efficiency in saturation of the inverse Class F module reached 70 %, placing this amplifier in the state-of-the-art for amplifiers using GaN-HEMT devices at frequencies close to 2.4-GHz.
  • Keywords
    HEMT integrated circuits; III-V semiconductors; field effect transistors; gallium compounds; integrated circuit design; microwave integrated circuits; microwave power amplifiers; wide band gap semiconductors; FET device; GaN; HEMT devices; frequency 2.4 GHz; harmonic tuned RF/microwave high efficiency power amplifier design; harmonic tuned power amplifiers; hybrid amplifiers; inverse Class F amplifier; matching networks; Capacitance; Harmonic analysis; Microwave FETs; Microwave amplifiers; Power amplifiers; Power system harmonics; Gallium nitride; microwave amplifiers; power amplifiers; transistor intrinsic drain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Central America and Panama Convention (CONCAPAN XXXIV), 2014 IEEE
  • Conference_Location
    Panama City
  • Type

    conf

  • DOI
    10.1109/CONCAPAN.2014.7000427
  • Filename
    7000427