DocumentCode
1786788
Title
Layout decomposition for quadruple patterning lithography and beyond
Author
Bei Yu ; Pan, David Z.
Author_Institution
ECE Dept., Univ. of Texas at Austin, Austin, TX, USA
fYear
2014
fDate
1-5 June 2014
Firstpage
1
Lastpage
6
Abstract
For next-generation technology nodes, multiple patterning lithography (MPL) has emerged as a key solution, e.g., triple patterning lithography (TPL) for 14/11nm, and quadruple patterning lithography (QPL) for sub-10nm. In this paper, we propose a generic and robust layout decomposition framework for QPL, which can be further extended to handle any general K-patterning lithography (K>4). Our framework is based on the semidefinite programming (SDP) formulation with novel coloring encoding. Meanwhile, we propose fast yet effective coloring assignment and achieve significant speedup. To our best knowledge, this is the first work on the general multiple patterning lithography layout decomposition.
Keywords
mathematical programming; nanolithography; nanopatterning; K-patterning lithography; MPL; QPL; SDP formulation; TPL; coloring assignment; coloring encoding; layout decomposition; multiple patterning lithography; quadruple patterning lithography; semidefinite programming; triple patterning lithography; Color; Layout; Lithography; Programming; Runtime; Shape; Vectors; Layout Decomposition; Multiple Patterning Lithography;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location
San Francisco, CA
Type
conf
Filename
6881380
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