• DocumentCode
    1786788
  • Title

    Layout decomposition for quadruple patterning lithography and beyond

  • Author

    Bei Yu ; Pan, David Z.

  • Author_Institution
    ECE Dept., Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    For next-generation technology nodes, multiple patterning lithography (MPL) has emerged as a key solution, e.g., triple patterning lithography (TPL) for 14/11nm, and quadruple patterning lithography (QPL) for sub-10nm. In this paper, we propose a generic and robust layout decomposition framework for QPL, which can be further extended to handle any general K-patterning lithography (K>4). Our framework is based on the semidefinite programming (SDP) formulation with novel coloring encoding. Meanwhile, we propose fast yet effective coloring assignment and achieve significant speedup. To our best knowledge, this is the first work on the general multiple patterning lithography layout decomposition.
  • Keywords
    mathematical programming; nanolithography; nanopatterning; K-patterning lithography; MPL; QPL; SDP formulation; TPL; coloring assignment; coloring encoding; layout decomposition; multiple patterning lithography; quadruple patterning lithography; semidefinite programming; triple patterning lithography; Color; Layout; Lithography; Programming; Runtime; Shape; Vectors; Layout Decomposition; Multiple Patterning Lithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • Filename
    6881380