• DocumentCode
    1786796
  • Title

    Post-silicon validation of the IBM POWER8 processor

  • Author

    Nahir, Amir ; Dusanapudi, M. ; Kapoor, Shubham ; Reick, K. ; Roesner, Wolfgang ; Schubert, Klaus-Dieter ; Sharp, Keith ; Wetli, Greg

  • Author_Institution
    IBM Res., Austin, TX, USA
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The post-silicon validation phase in a processor´s design life cycle is geared towards finding all remaining bugs in the system. It is, in fact, our last opportunity to find functional and electrical bugs in the design before shipping it to customers. In this paper, we provide a high-level overview of the methodology and technologies put into use as part of the POWER8 post-silicon functional validation phase. We describe the results and list the primary factors that contributed to this highly successful bring-up.
  • Keywords
    computer debugging; integrated circuit design; microprocessor chips; IBM POWER8 processor; POWER8 post-silicon functional validation phase; electrical bugs; functional bugs; processor design life; Acceleration; Computer bugs; Debugging; Hardware; Monitoring; Silicon; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
  • Conference_Location
    San Francisco, CA
  • Type

    conf

  • DOI
    10.1145/2593069.2593183
  • Filename
    6881383