DocumentCode
1786796
Title
Post-silicon validation of the IBM POWER8 processor
Author
Nahir, Amir ; Dusanapudi, M. ; Kapoor, Shubham ; Reick, K. ; Roesner, Wolfgang ; Schubert, Klaus-Dieter ; Sharp, Keith ; Wetli, Greg
Author_Institution
IBM Res., Austin, TX, USA
fYear
2014
fDate
1-5 June 2014
Firstpage
1
Lastpage
6
Abstract
The post-silicon validation phase in a processor´s design life cycle is geared towards finding all remaining bugs in the system. It is, in fact, our last opportunity to find functional and electrical bugs in the design before shipping it to customers. In this paper, we provide a high-level overview of the methodology and technologies put into use as part of the POWER8 post-silicon functional validation phase. We describe the results and list the primary factors that contributed to this highly successful bring-up.
Keywords
computer debugging; integrated circuit design; microprocessor chips; IBM POWER8 processor; POWER8 post-silicon functional validation phase; electrical bugs; functional bugs; processor design life; Acceleration; Computer bugs; Debugging; Hardware; Monitoring; Silicon; Software;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location
San Francisco, CA
Type
conf
DOI
10.1145/2593069.2593183
Filename
6881383
Link To Document