DocumentCode :
1786836
Title :
Reliability-aware register binding for control-flow intensive designs
Author :
Liang Chen ; Tahoori, Mehdi
Author_Institution :
Karlsruhe Inst. of Technol., Karlsruhe, Germany
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
As soft error is a major reliability issue for nanoscale VLSI, addressing it during high level synthesis can have a significant impact on the overall design quality. Motivated by the observation that for behavioral designs, especially control-flow intensive ones, variables have nonuniform soft error vulnerabilities, we propose a novel reliability-aware register binding technique to explore more effective soft error mitigation during high level synthesis. We first perform a comprehensive variable vulnerability analysis at the behavioral level, by considering error propagation and masking in both control and data flow. Then an optimization based on integer linear programming is used to incorporate vulnerabilities into the register binding phase with a selective register protection scheme. The experimental results reveal that the proposed technique can achieve significant soft error mitigation (60% coverage of the total vulnerabilities) with a small portion (20%) of register protection.
Keywords :
VLSI; data flow graphs; high level synthesis; integer programming; integrated circuit reliability; linear programming; optimisation; radiation hardening (electronics); control-flow intensive designs; data flow graph; design quality; error masking; error propagation; high level synthesis; integer linear programming; nanoscale VLSI; nonuniform soft error vulnerability; optimization; reliability-aware register binding phase technique; selective register protection scheme; soft error mitigation; variable vulnerability analysis; Benchmark testing; Complexity theory; Equations; Optimization; Registers; Reliability engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2593069.2593200
Filename :
6881402
Link To Document :
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