DocumentCode :
1786927
Title :
Statistical battery models and variation-aware battery management
Author :
Donghwa Shin ; Macii, E. ; Poncino, Massimo
Author_Institution :
Yeungnam Univ., Gyeongsan, South Korea
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
Cell-to-cell variability of batteries is a well-known problem especially when it comes to assembling large battery packs. Different battery cells exhibit substantial variability among them due to manufacturing tolerances, which should be carefully assessed and managed. Although battery packs usually incorporate some cell balancing circuitry, it is supposed to balance cell voltages dynamically at the expense of bypassed (not stored) charge. In this paper, we address the issue of how to consider variability when building battery packs based on a recently introduced combined cell-to-cell variation model of the capacity and of the internal resistance of a Li-Ion battery that accounts for variability effects in the cell manufacturing process. We attempt to figure out what kind of pack-level variability should be managed to reduce the cost of the cell balancing. We qualitatively evaluate inter- and intra-column variance minimizing cell placement approaches from the perspective of the passive cell balancing cost while considering the correlation between capacity and internal resistance. The intra-column minimization approach reduce the charging time and bypassed current by differentiating the column currents.
Keywords :
battery management systems; secondary cells; battery packs; cell balancing cost reduction; cell manufacturing process; combined cell-to-cell variation model; internal resistance; intra-column minimization approach; lithium-ion battery; pack-level variability; passive cell balancing cost; statistical battery models; variation-aware battery management; Arrays; Batteries; Computational modeling; Integrated circuit modeling; Resistance; Solid modeling; Battery Modeling; Constant Current - Constant Voltage (CC-CV); Datasheet; Peukert´s law;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2593069.2596689
Filename :
6881462
Link To Document :
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