Title :
Retention trimming for wear reduction of flash memory storage systems
Author :
Liang Shi ; Kaijie Wu ; Mengying Zhao ; Xue, Chun Jason ; Sha, Edwin H-M
Author_Institution :
Dept. of Comput. Sci., Chongqing Univ., Chongqing, China
Abstract :
NAND flash memory has been widely applied in embedded systems, personal computer systems, and data centers. However, with the development of flash memory, including its technology scaling and density improvement, the endurance of flash memory becomes a bottleneck. In this work, with the understanding of the relationship between data retention time and flash wearing, a retention trimming approach, which trims data retention time based on the time intervals between data updating, is proposed to reduce the wearing of flash memory. Reduced wearing of flash memory will improve the endurance of the flash memory. Extensive experimental results show that the proposed technique achieves significant wearing reduction for flash memory through retention trimming.
Keywords :
fault tolerant computing; flash memories; wear resistance; NAND flash memory; data centers; data retention time; data updating; density improvement; embedded systems; flash memory storage system; personal computer systems; retention trimming approach; technology scaling; time intervals; wear reduction; Ash; Engines; Error correction codes; Flash memories; Memory management; Programming; Threshold voltage; Flash Memory; Retention Time; Wear Reduction;
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA