DocumentCode :
1786960
Title :
Circuit camouflage integration for hardware IP protection
Author :
Cocchi, Ronald P. ; Baukus, James P. ; Lap Wai Chow ; Wang, B. Jiangyun
Author_Institution :
SypherMedia Int. Inc., Westminster, CA, USA
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
5
Abstract :
Circuit camouflage technologies can be integrated into standard logic cell developments using traditional CAD tools. Camouflaged logic cells are integrated into a typical design flow using standard front end and back end models. Camouflaged logic cells obfuscate a circuit´s function by introducing subtle cell design changes at the GDS level. The logic function of a camouflaged logic cell is extremely difficult to determine through silicon imaging analysis preventing netlist extraction, clones and counterfeits. The application of circuit camouflage as part of a customer´s design flow can protect hardware IP from reverse engineering. Camouflage fill techniques further inhibit Trojan circuit insertion by completely filling the design with realistic circuitry that does not affect the primary design function. All unused silicon appears to be functional circuitry, so an attacker cannot find space to insert a Trojan circuit. The integration of circuit camouflage techniques is compatible with standard chip design flows and EDA tools, and ICs using such techniques have been successfully employed in high-attack commercial and government segments. Protected under issued and pending patents.
Keywords :
invasive software; logic design; logic gates; reverse engineering; CAD tools; EDA tools; GDS level; Trojan circuit insertion; back end models; camouflage fill techniques; camouflaged logic cells; cell design changes; chip design flows; circuit camouflage technologies; front end models; functional circuitry; hardware IP; logic function; netlist extraction; reverse engineering; silicon imaging analysis; standard logic cell developments; Application specific integrated circuits; Foundries; Layout; Libraries; Logic gates; Metals; Standards; Anti-Cloning; Anti-Counterfeit; Anti-Tamper; Anti-Trojan; Camouflage; Design; Obfuscation; Reverse Engineering; Security;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2593069.2602554
Filename :
6881480
Link To Document :
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