DocumentCode :
1786972
Title :
NoC-sprinting: Interconnect for fine-grained sprinting in the dark silicon era
Author :
Jia Zhan ; Yuan Xie ; Guangyu Sun
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
fYear :
2014
fDate :
1-5 June 2014
Firstpage :
1
Lastpage :
6
Abstract :
The rise of utilization wall limits the number of transistors that can be powered on in a single chip and results in a large region of dark silicon. While such phenomenon has led to disruptive innovation in computation, little work has been done for the Network-on-Chip (NoC) design. NoC not only directly influences the overall multi-core performance, but also consumes a significant portion of the total chip power. In this paper, we first reveal challenges and opportunities of designing power-efficient NoC in the dark silicon era. Then we propose NoC-Sprinting: based on the workload characteristics, it explores fine-grained sprinting that allows a chip to flexibly activate dark cores for instantaneous throughput improvement. In addition, it investigates topological/routing support and thermal-aware floorplanning for the sprinting process. Moreover, it builds an efficient network power-management scheme that can mitigate the dark silicon problems. Experiments on performance, power, and thermal analysis show that NoC-sprinting can provide tremendous speedup, increase sprinting duration, and meanwhile reduce the chip power significantly.
Keywords :
integrated circuit layout; logic design; network-on-chip; silicon; thermal management (packaging); NoC design; NoC-sprinting process; dark silicon era; fine-grained sprinting process; network power-management scheme; network-on-chip design; routing support; thermal analysis; thermal-aware floorplanning; topological support; Multicore processing; Network topology; Routing; Silicon; Switches; System recovery; Topology; Computational Sprinting; Dark Silicon; Network-on-Chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
Type :
conf
DOI :
10.1145/2593069.2593165
Filename :
6881487
Link To Document :
بازگشت