DocumentCode
1787009
Title
TI-TRNG: Technology independent true random number generator
Author
Rahman, M.T. ; Kan Xiao ; Forte, Domenic ; Xuhei Zhang ; Shi, Jack ; Tehranipoor, Mohammad
Author_Institution
ECE Dept., Univ. of Connecticut, Storrs, CT, USA
fYear
2014
fDate
1-5 June 2014
Firstpage
1
Lastpage
6
Abstract
True random number generators (TRNGs) are needed for a variety of security applications and protocols. The quality (randomness) of TRNGs depends on sensitivity to random noise, environmental conditions, and aging. Random sources of noise improve TRNG quality. In older or more mature technologies, the random sources are limited resulting in low TRNG quality. Prior work has also shown that attackers can manipulate voltage supply and temperature to bias the TRNG output. In this paper, we propose bias detection mechanisms and a technology independent TRNG (TI-TRNG) architecture. The TI-TRNG enhances power supply noise for older technologies and uses a self-calibration mechanism that reduces bias in TRNG output due to aging and attacks. Experiment results on 130nm, 90nm, and 45nm FPGAs demonstrate the quality of random sequences from the TI-TRNG across aging and different environmental conditions.
Keywords
field programmable gate arrays; random noise; random number generation; security of data; FPGAs; TI-TRNG; bias detection mechanisms; bias reduction; environmental conditions; power supply noise; protocols; random noise; random sequences; security applications; self-calibration mechanism; size 130 nm; size 45 nm; size 90 nm; technology independent TRNG architecture; technology independent true random number generator; Aging; Entropy; Jitter; NIST; Noise; Radiation detectors; Tuning; Attacks detection; Random supply noise; True random number generator; Tunable ring oscillator;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location
San Francisco, CA
Type
conf
DOI
10.1145/2593069.2593236
Filename
6881506
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