Title :
Techniques for foundry identification
Author :
Wendt, James B. ; Koushanfar, Farinaz ; Potkonjak, Miodrag
Author_Institution :
Comput. Sci. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
Foundry identification is essential for many tasks including intellectual property protection, trust, and preventing counterfeiting. In this paper, we introduce statistical techniques for foundry detection, specifically for identifying from which foundry a particular chip originates from. The key idea is to consider the distributions of channel lengths and threshold voltages after employing a variant of SAT that extracts these two metrics. We apply Kolmogorov-Smirnov and other statistical tests for comparing the two empirical distributions. Finally, we study the effects of sample size and measurement error on the correct identification rate and establish an interval of confidence using resubstitution techniques.
Keywords :
foundries; industrial property; integrated circuit design; integrated circuit manufacture; nonparametric statistics; semiconductor industry; statistical distributions; statistical testing; Kolmogorov-Smirnov test; SAT; channel length distribution; chip; counterfeiting prevention; empirical distribution comparison; foundry detection; foundry identification technique; intellectual property protection; measurement error; nonparametric statistical test; resubstitution technique; sample size; statistical technique; threshold voltage; trust; Delays; Equations; Foundries; Integrated circuit modeling; Logic gates; Mathematical model;
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA
DOI :
10.1145/2593069.2593228
