Title :
Protecting SRAM-based FPGAs against multiple bit upsets using erasure codes
Author :
Rao, Parthasarathy M. B. ; Ebrahimi, Mojtaba ; Seyyedi, Razi ; Tahoori, Mehdi B.
Author_Institution :
Karlsruhe Inst. of Technol., Karlsruhe, Germany
Abstract :
Multiple bit upsets due to radiation-induced soft errors are a major concern in nanoscale technology nodes. Once such errors occur in the configuration frames of an FPGA device, they permanently affect the functionality of the mapped design. The combination of error correction schemes and configuration scrubbing is an efficient approach to avoid such permanent errors. Existing solutions exploit coding techniques with considerably high overhead to protect configuration frames against multiple bit upsets. In this paper, we propose a generic scrubbing scheme which reconstructs the erroneous configuration frame based on the concept of erasure codes. Our proposed scheme does not require any changes to the FPGA architecture. Experimental results on a Xilinx Virtex-6 FPGA device show that the proposed scheme achieves error recovery coverage of 99.30% with only 3% resource occupation while the mean time to repair is comparable with previous schemes.
Keywords :
SRAM chips; error correction codes; field programmable gate arrays; radiation hardening (electronics); SRAM-based FPGAs; Xilinx Virtex-6 FPGA device; coding techniques; erasure codes; erroneous configuration frame; error correction schemes; error recovery; generic scrubbing scheme; multiple bit upsets; nanoscale technology nodes; radiation-induced soft errors; Decoding; Encoding; Error correction; Error correction codes; Field programmable gate arrays; Performance evaluation; Random access memory;
Conference_Titel :
Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE
Conference_Location :
San Francisco, CA