• DocumentCode
    178730
  • Title

    Person Re-identification via Discriminative Accumulation of Local Features

  • Author

    Matsukawa, T. ; Okabe, Toshiya ; Sato, Yuuki

  • Author_Institution
    Univ. of Tokyo, Tokyo, Japan
  • fYear
    2014
  • fDate
    24-28 Aug. 2014
  • Firstpage
    3975
  • Lastpage
    3980
  • Abstract
    Metric learning to learn a good distance metric for distinguishing different people while being insensitive to intra-person variations is widely applied to person re-identification. In previous works, local histograms are densely sampled to extract spatially localized information of each person image. The extracted local histograms are then concatenated into one vector that is used as an input of metric learning. However, the dimensionality of such a concatenated vector often becomes large while the number of training samples is limited. This leads to an over fitting problem. In this work, we argue that such a problem of over-fitting comes from that it is each local histogram dimension (e.g. color brightness bin) in the same position is treated separately to examine which part of the image is more discriminative. To solve this problem, we propose a method that analyzes discriminative image positions shared by different local histogram dimensions. A common weight map shared by different dimensions and a distance metric which emphasizes discriminative dimensions in the local histogram are jointly learned with a unified discriminative criterion. Our experiments using four different public datasets confirmed the effectiveness of the proposed method.
  • Keywords
    feature extraction; learning (artificial intelligence); common weight map; concatenated vector; discriminative image positions; distance metric; extracted local histograms; intra-person variations; local feature discriminative accumulation; local histogram dimension; metric learning; over fitting problem; person image; person re-identification; spatially localized information extraction; unified discriminative criterion; Feature extraction; Histograms; Image color analysis; Measurement; Optimization; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2014 22nd International Conference on
  • Conference_Location
    Stockholm
  • ISSN
    1051-4651
  • Type

    conf

  • DOI
    10.1109/ICPR.2014.681
  • Filename
    6977394