DocumentCode :
1787592
Title :
BIST-PUF: Online, hardware-based evaluation of physically unclonable circuit identifiers
Author :
Hussain, Siam U. ; Yellapantula, Sudha ; Majzoobi, Mehrdad ; Koushanfar, Farinaz
Author_Institution :
ECE Dept., Rice Univ., Houston, TX, USA
fYear :
2014
fDate :
2-6 Nov. 2014
Firstpage :
162
Lastpage :
169
Abstract :
Physical Unclonable Functions (PUF) are of increasing importance due to their many hardware security applications including chip fingerprinting, metering, authentication, anti-counterfeiting, and supply-chain tracing, e.g., DARPA SHIELD. This paper presents BIST-PUF, the first built-in-self-test (BIST) methodology for online evaluation of weak and strong PUFs. BIST-PUF provides a paradigm shift in the evaluation of the un-clonable circuit identifiers: unlike earlier known PUF evaluation suites that are software-based and offline, BIST-PUF enables on-the-fly assessment of the desired PUF properties all in hardware. More specifically, the BIST-PUF structure is designed to evaluate two main properties of PUFs, namely unpredictability and stability. These properties are important for ensuring robustness and security in face of operational, structural, and environmental fluctuations due to variations, aging or adversarial acts. For BIST-PUF unpredictability evaluation, we identify and adopt the tests of randomness that are amenable to hardware implementation. For stability assessment, the BIST-PUF suggests three distinct methods, namely, sensor-based, parametric interrogation, and multiple interrogations. Proof-of-concept implementation of the BIST-PUF in FPGA demonstrates its low overhead, effectiveness, and practicality.
Keywords :
built-in self test; field programmable gate arrays; BIST-PUF unpredictability evaluation; FPGA; PUF online hardware-based evaluation; built-in-self-test methodology; hardware security applications; multiple interrogations; parametric interrogation; physical unclonable functions; physically unclonable circuit identifiers; sensor-based methods; Built-in self-test; Circuit stability; Delays; Hardware; Robustness; Security; BIST; Built In Self Test; DARPA SHIELD; Hardware security; PUF; Physical Unclonable Functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Type :
conf
DOI :
10.1109/ICCAD.2014.7001347
Filename :
7001347
Link To Document :
بازگشت