• DocumentCode
    1787654
  • Title

    ICCAD-2014 CAD contest in design for manufacturability flow for advanced semiconductor nodes and benchmark suite

  • Author

    Topaloglu, Rasit O.

  • Author_Institution
    Semicond. R&D Center, IBM, Hopewell Junction, NY, USA
  • fYear
    2014
  • fDate
    2-6 Nov. 2014
  • Firstpage
    367
  • Lastpage
    368
  • Abstract
    We introduce the fill optimization problem and benchmarks. We provide two new hotspot definitions, slot line deviation and outliers, both of which pertain to yield. We provide the inputs, expected output, as well as objectives and constraints of the problem.
  • Keywords
    design for manufacture; optimisation; production engineering computing; semiconductor industry; DFM; benchmark suite; design for manufacturability; fill optimization problem; hotspot definitions; semiconductor nodes; slot line deviation; Central Processing Unit; Integrated circuit modeling; Layout; Measurement; Program processors; Runtime; Slot lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • Type

    conf

  • DOI
    10.1109/ICCAD.2014.7001377
  • Filename
    7001377
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1787654