Title :
A zonotoped macromodeling for reachability verification of eye-diagram in high-speed I/O links with jitter
Author :
Sai Manoj, P.D. ; Hao Yu ; Chenji Gu ; Cheng Zhuo
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
Abstract :
With the use of zonotope to model uncertainty of input data pattern (or jitter), a reachability-based verification is developed in this paper to compute the worst-case eye-diagram. The proposed zonotope-based reachability analysis can consider both spatial and temporal variations in one-time simulation of high-speed I/O links. Moreover, nonlinear zonotoped macromodeling is developed to reduce the verification complexity. As shown by experiments, the zonotoped macromodel achieves up to 450× speedup compared to the Monte Carlo simulation of the original model within small error under specified macromodel order for highspeed I/O links verification.
Keywords :
CMOS integrated circuits; Monte Carlo methods; high-speed integrated circuits; integrated circuit modelling; jitter; reachability analysis; Monte Carlo simulation; high-speed I/O links; input data pattern; jitter; model uncertainty; nonlinear zonotoped macromodeling; one-time simulation; reachability verification; spatial variations; temporal variations; verification complexity; worst-case eye-diagram; zonotope-based reachability analysis; Bit error rate; Clocks; Generators; Jitter; Monte Carlo methods; Reachability analysis; Vectors;
Conference_Titel :
Computer-Aided Design (ICCAD), 2014 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
DOI :
10.1109/ICCAD.2014.7001428