• DocumentCode
    1787842
  • Title

    Smart robust interpolator

  • Author

    Essai, M.H.

  • Author_Institution
    Al-Azhar Univ., Qena, Egypt
  • fYear
    2014
  • fDate
    June 30 2014-July 4 2014
  • Firstpage
    110
  • Lastpage
    113
  • Abstract
    A proposed smart robust interpolator that based on robust trained neural networks is presented and compared with other popular interpolation methods widely implemented in mathematical, industrial and manufacturing applications. Recently many interpolation methods have been developed, and examined. Most of them are based on looking for the optimal interpolation trajectories based on the well known data set. However, it is rare to build robust interpolator based on noisy data, and this is one of the most popular topics in industrial testing and measurement applications. The smart robust neural network (SRNN) interpolator reported in this paper provides a convenient and simple way to solve this problem and offers more accurate interpolation results based on given data set in the presence of outliers. This method can be implemented in many applications, such as manipulators measurements and calibrations, automations, unmanned air vehicles, Upward Velocity of Rockets, and semiconductor manufacturing processes.
  • Keywords
    interpolation; mathematics computing; neural nets; SRNN interpolator; automations; calibrations; data set; manipulator measurements; noisy data; optimal interpolation trajectory; robust trained neural networks; rocket upward velocity; semiconductor manufacturing processes; smart robust interpolator; smart robust neural network; unmanned air vehicles; Educational institutions; Extraterrestrial measurements; Interpolation; Neural networks; Pollution measurement; Robustness; Splines (mathematics); M-estimators; interpolation; robust interpolator; robust trained neural networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro/Nanotechnologies and Electron Devices (EDM), 2014 15th International Conference of Young Specialists on
  • Conference_Location
    Novosibirsk
  • ISSN
    2325-4173
  • Print_ISBN
    978-1-4799-4669-3
  • Type

    conf

  • DOI
    10.1109/EDM.2014.6882488
  • Filename
    6882488