DocumentCode :
1788594
Title :
Robust control of rapid thermal processes applied to vapor deposition processing
Author :
Aranovskiy, Stanislav ; Kapitonov, Aleksandr ; Bobtsov, Alexey ; Pyrkin, Anton ; Zavarin, Evgeny ; Davydov, Denis ; Ortega, Romeo
Author_Institution :
Dept. of Control Syst. & Inf., ITMO Univ., St. Petersburg, Russia
fYear :
2014
fDate :
6-8 Oct. 2014
Firstpage :
578
Lastpage :
583
Abstract :
Rapid thermal processes are an essential part of vapor deposition processing, which is widely used in semiconductor production; quality of the produced semiconductors significantly depends on accuracy of temperature control in an epitaxy process. From control point of view, temperature control is a nonlinear control problem. In the paper a control law for a family of nonlinear systems with polynomial nonlinearity is proposed and proved to provide asymptotic stability. The proposed control law is applied to a rapid thermal process control problem; experimental results for a vapor deposition processing are presented and illustrate a good tracking performance.
Keywords :
asymptotic stability; control nonlinearities; nonlinear control systems; process control; product quality; rapid thermal processing; robust control; semiconductor technology; temperature control; vapour deposition; asymptotic stability; control law; epitaxy process; nonlinear control problem; nonlinear systems; polynomial nonlinearity; rapid thermal process control problem; robust control; semiconductor production; semiconductor quality; temperature control; tracking performance; vapor deposition processing; Epitaxial growth; Inductors; Polynomials; Process control; Rapid thermal processing; Temperature control; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultra Modern Telecommunications and Control Systems and Workshops (ICUMT), 2014 6th International Congress on
Conference_Location :
St. Petersburg
Type :
conf
DOI :
10.1109/ICUMT.2014.7002165
Filename :
7002165
Link To Document :
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