DocumentCode :
1788650
Title :
Validation of an on-chip watchdog for embedded systems exposed to radiation and conducted EMI
Author :
Oliveira, C. ; Benfica, J. ; Bolzani Poehls, L.M. ; Vargas, F. ; Lipovetzky, J. ; Lutenberg, A. ; Gatti, Emilio ; Hernandez, F.
Author_Institution :
Catholic Univ. - PUCRS, Porto Alegre, Brazil
fYear :
2014
fDate :
5-7 Nov. 2014
Firstpage :
1
Lastpage :
6
Abstract :
Due to stringent constraints such as battery-powered, high-speed, low-voltage power supply and noise-exposed operation, safety-critical real-time embedded systems are often subject to transient faults originated from a large spectrum of noisy sources; among them, conducted Electromagnetic Interference (EMI) and radiation. As the major consequence, the system´s reliability degrades. In this paper, we present the most recent results involving the validation analysis of a hardware-based intellectual property (IP) core, namely Real-Time Operating System - Guardian (RTOS-G). This is an on-chip watchdog that monitors the RTOS´ activity in order to detect faults that corrupt tasks´ execution flow in embedded systems running preemptive RTOS. Experimental results based on the Plasma processor IP core running different test programs that exploit several RTOS resources have been developed. During test execution, the proposed system was aged by means of total ionizing dose (TID) radiation and then, exposed to conducted EMI according to the international standard IEC 61.000-4-29 (voltage dips on the VDD power pins). The obtained results demonstrate the proposed approach provides higher fault coverage and reduced fault latency when compared to the native (software) fault detection mechanisms embedded in the kernel of the RTOS.
Keywords :
IEC standards; electromagnetic interference; embedded systems; fault diagnosis; logic circuits; microprocessor chips; radiation; transient analysis; EMI conduction; IEC 61.000-4-29; RTOS-G; TID radiation; electromagnetic interference; fault coverage; fault detection mechanism; fault latency; intellectual property core; noise-exposed operation; plasma processor IP core; radiation exposure; real-time operating system guardian; safety-critical real-time embedded system; single on-chip watchdog validation; system reliability; test program; total ionizing dose radiation; transient fault; Benchmark testing; Circuit faults; Electromagnetic interference; Embedded systems; Field programmable gate arrays; Monitoring; Real-time systems; Electromagnetic Interference (EMI); Embedded System; On-Chip Watchdog; Total Ionizing Dose (TID) Radiation; Validation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Programmable Logic (SPL), 2014 IX Southern Conference on
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4799-6846-6
Type :
conf
DOI :
10.1109/SPL.2014.7002212
Filename :
7002212
Link To Document :
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