• DocumentCode
    1788821
  • Title

    Effect of dopant concentration on the pore formation of porous silicon on n-type silicon

  • Author

    Nadia, Siti ; Ali, Nihad K. ; Ahmad, Mohd Ridzuan ; Haidary, Sazan M.

  • Author_Institution
    Fac. of Electr. Eng., Univ. Teknol. Malaysia, Skudai, Malaysia
  • fYear
    2014
  • fDate
    2-4 Sept. 2014
  • Firstpage
    53
  • Lastpage
    55
  • Abstract
    This paper investigated the effect of different doped n-type silicon on pores formation. We found that star-like shape pores occurred when low doped concentration n-type silicon sample was used while high doped concentration produced normal pores hole-shape on the surface. By increasing etching time will cause the neighbouring star-like shape branches to combine and produced bigger pores. Reasons related on this star-like shape pores formation such as the effect of materials impurities, dynamic stress and space charge region effect (SCR) were discussed.
  • Keywords
    doping profiles; elemental semiconductors; etching; internal stresses; porous semiconductors; silicon; space charge; Si; dopant concentration; dynamic stress; etching time; materials impurities; n-type silicon; pore formation; porous silicon; space charge region effect; star-like shape pores; Current density; Etching; Shape; Silicon; Thyristors; Concentration; Dopant; N-Type Silicon; Porous;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics (ICP), 2014 IEEE 5th International Conference on
  • Conference_Location
    Kuala Lumpur
  • Type

    conf

  • DOI
    10.1109/ICP.2014.7002308
  • Filename
    7002308